Preferred Name |
electron microscopy |
|
Synonyms |
EM |
|
Definitions |
Microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. |
|
ID |
http://purl.obolibrary.org/obo/CHMO_0000068 |
|
definition |
Microscopy where the specimen is bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected. |
|
has participant | ||
has_alternative_id |
FIX:0000051 |
|
has_exact_synonym |
EM |
|
id |
CHMO:0000068 |
|
label |
electron microscopy |
|
notation |
CHMO:0000068 |
|
prefLabel |
electron microscopy |
|
subClassOf |