loading...| Preferred Name |
Non-contact mode technique |
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| Synonyms |
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| Definitions |
The tip of the cantilever does not contact the sample surface. The van der Waals forces, which are strongest from 1 nm to 10 nm above the surface, or any other long range force which extends above the surface acts to decrease the resonance frequency of the cantilever. The absence of repulsive forces permits its use in the imaging of soft samples and does not require conducting samples. |
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| ID |
http://purl.obolibrary.org/obo/ID_0000135 |
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| definition |
The tip of the cantilever does not contact the sample surface. The van der Waals forces, which are strongest from 1 nm to 10 nm above the surface, or any other long range force which extends above the surface acts to decrease the resonance frequency of the cantilever. The absence of repulsive forces permits its use in the imaging of soft samples and does not require conducting samples. |
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| has_obo_namespace |
bcteo |
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| id |
ID:0000135 |
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| label |
Non-contact mode technique |
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| notation |
ID:0000135 |
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| prefLabel |
Non-contact mode technique |
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| treeView | ||
| subClassOf |
| Delete | Mapping To | Ontology | Source |
|---|---|---|---|
| http://purl.obolibrary.org/obo/ID_0000135 | OCD | SAME_URI | |
| http://purl.obolibrary.org/obo/ID_0000135 | IDQA | SAME_URI |