loading...| Preferred Name |
Atomic Force Microscopy |
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| Synonyms |
AFM |
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| Definitions |
Very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable the very precise scanning. |
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| ID |
http://purl.obolibrary.org/obo/ID_0000060 |
|
| definition |
Very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable the very precise scanning. |
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| has_obo_namespace |
bcteo |
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| has_related_synonym |
AFM |
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| id |
ID:0000060 |
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| label |
Atomic Force Microscopy |
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| notation |
ID:0000060 |
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| prefLabel |
Atomic Force Microscopy |
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| treeView | ||
| subClassOf |