Atomic force microscopy (AFM) A type of atomic probe microscopy in which a small probe, consisting of a tiny chip of diamond, is held on a spring-loaded cantilever in contact with the surface of the sample. The probe is moved slowly across the surface and the tracking force between the tip and the surface is monitored. The probe is raised and lowered so as to keep this force constant, and a profile of the surface is produced. Scanning the probe over the sample gives a computer-generated contour map of the surface. A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.

Ontology1271664172453:Atomic_force_microscopy

Atomic_force_microscopy

Atomic Force Microscopy Microscopy, Atomic Force Scanning Force Microscopy Force Microscopies Force microscopy AFM