Preferred Name |
Atomic Force Microscopy |
|
Synonyms |
Atomic Force Microscopy Scanning Force Microscopy |
|
Definitions |
A technique utilizing a scanning probe to image and analyze the surface of a material with atomic-level resolution. |
|
ID |
http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#C17754 |
|
code |
C17754 |
|
DEFINITION |
A technique utilizing a scanning probe to image and analyze the surface of a material with atomic-level resolution. |
|
FULL_SYN |
Atomic Force Microscopy Scanning Force Microscopy |
|
label |
Atomic Force Microscopy |
|
Legacy Concept Name |
Atomic_Force_Microscopy |
|
Preferred_Name |
Atomic Force Microscopy |
|
prefixIRI |
Thesaurus:C17754 |
|
Semantic_Type |
Laboratory Procedure |
|
UMLS_CUI |
C0242849 |
|
subClassOf |
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