Preferred Name | atomic force microscopy | |
Synonyms |
atomic force imaging scanning force microscopy atomic-force microscopy AFM SFM |
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Definitions |
Microscopy which uses a sharp spike (known as a 'tip') mounted on the end of a cantilever to scan the surface of the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the force experienced by the tip as a function of position. A feedback loop is used to maintain a fixed relationship between the tip and surface during scanning. |
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ID |
http://purl.obolibrary.org/obo/CHMO_0000113 |
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definition |
Microscopy which uses a sharp spike (known as a 'tip') mounted on the end of a cantilever to scan the surface of the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the force experienced by the tip as a function of position. A feedback loop is used to maintain a fixed relationship between the tip and surface during scanning. |
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has_exact_synonym |
atomic force imaging scanning force microscopy atomic-force microscopy AFM SFM |
|
id |
CHMO:0000113 |
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label |
atomic force microscopy |
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notation |
CHMO:0000113 |
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prefLabel |
atomic force microscopy |
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subClassOf |