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loading...| Preferred Name | atomic force microscopy | |
| Synonyms |
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| Definitions |
the scanning probe is maintained at a fixed distance above the surface e of the specimen by van der Waals forces |
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| ID |
http://purl.obolibrary.org/obo/FBbi_00000259 |
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| definition |
the scanning probe is maintained at a fixed distance above the surface e of the specimen by van der Waals forces |
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| has_obo_namespace |
image |
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| id |
FBbi:00000259 |
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| label |
atomic force microscopy |
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| notation |
FBbi:00000259 |
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| prefLabel |
atomic force microscopy |
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| subClassOf |
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