Preferred Name | Atomic Force Microscopy | |
Synonyms |
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ID |
http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#Atomic_Force_Microscopy |
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DEFINITION |
A technique utilizing a scanning probe to image and analyze the surface of a material with atomic-level resolution. |
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FULL_SYN |
Scanning Force Microscopy |
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isDefinedBy |
A technique utilizing a scanning probe to image and analyze the surface of a material with atomic-level resolution. |
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label |
Atomic Force Microscopy |
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prefixIRI |
Thesaurus:Atomic_Force_Microscopy |
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prefLabel |
Atomic Force Microscopy |
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Synonym |
Scanning Force Microscopy |
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subClassOf |
http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#Atomic_Resolution_Microscopy |
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